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Proceedings Papers

Internal Temperature Distribution of a Vertical-Cavity Surface-Emitting Lasers Measured by Scanning Thermal Microscopy

K. Luo, R. W. H. Herrick, A. Majumdar, P. Petroff

Proc. ASME. IMECE96, Microelectromechanical Systems (MEMS), 25-30, November 17–22, 1996

Publisher: American Society of Mechanical Engineers

Paper No: IMECE1996-1332

https://doi.org/10.1115/IMECE1996-1332

View Paper titled, Internal Temperature Distribution of a Vertical-Cavity Surface-Emitting Lasers Measured by Scanning Thermal Microscopy

Topics: Cavities, Lasers, Microscopy, Temperature distribution, Temperature, Heat, Mirrors, Quantum wells, Wavelength

Proceedings Papers

Infrared Photodetection in the Picowatt Range Using Uncooled Micromechanical Sensors

J. Lai, T. Perazzo, Z. Shi, A. Majumdar

Proc. ASME. IMECE96, Microelectromechanical Systems (MEMS), 55-59, November 17–22, 1996

Publisher: American Society of Mechanical Engineers

Paper No: IMECE1996-1336

https://doi.org/10.1115/IMECE1996-1336

View Paper titled, Infrared Photodetection in the Picowatt Range Using Uncooled Micromechanical Sensors

Topics: Cantilevers, Density, Microcantilevers, Noise (Sound), Radiation (Physics), Resolution (Optics), Sensors, Temperature, White noise

Proceedings Papers

Infrared Vision Using an Uncooled Thermo-Opto-Mechanical Camera: Design, Microfabrication, and Performance

M. Mao, T. Perazzo, O. Kwon, Y. Zhao, A. Majumdar, J. Varesi, P. Norton

Proc. ASME. IMECE99, Micro-Electro-Mechanical Systems (MEMS), 309-316, November 14–19, 1999

Publisher: American Society of Mechanical Engineers

Paper No: IMECE1999-0285

https://doi.org/10.1115/IMECE1999-0285

View Paper titled, Infrared Vision Using an Uncooled Thermo-Opto-Mechanical Camera: Design, Microfabrication, and Performance

Topics: Design, Microfabrication, Cantilevers, Temperature, Absorption, Cantilever beams, Electrical conductance, Thermomechanics, Adhesion, Cavities

Proceedings Papers

Scanning Thermal Microscopy Study of Dissipation in Current-Carrying Carbon Nanotubes

L. Shi, P. Kim, S. Plyasunov, A. Bachtold, P. L. McEuen, A. Majumdar

Proc. ASME. IMECE2001, Heat Transfer: Volume 7 — Heat Transfer in Electronic Equipment, Student Research, and Visualization Techniques, 247-252, November 11–16, 2001

Publisher: American Society of Mechanical Engineers

Paper No: IMECE2001/HTD-24401

https://doi.org/10.1115/IMECE2001/HTD-24401

View Paper titled, Scanning Thermal Microscopy Study of Dissipation in Current-Carrying Carbon Nanotubes

Topics: Carbon nanotubes, Energy dissipation, Microscopy, Temperature, Electric fields, Emissions, Heat, Imaging, Joules, Metals

Proceedings Papers

Design and Fabrication of an Optomechanical Uncooled Infrared Imaging System

Y. Zhao, J. Yamaguchi, J. Choi, S. Morales, R. Horowitz, A. Majumdar, P. Norton, J. Kitching, H. Li, M. Athavale

Proc. ASME. IMECE2001, Heat Transfer: Volume 1 — Fundamentals of Heat Transfer, 367-370, November 11–16, 2001

Publisher: American Society of Mechanical Engineers

Paper No: IMECE2001/HTD-24142

https://doi.org/10.1115/IMECE2001/HTD-24142

View Paper titled, Design and Fabrication of an Optomechanical Uncooled Infrared Imaging System

Topics: Design, Infrared imaging, Manufacturing, Cantilevers, Temperature, Microfabrication, Absorption, Deformation, Lasers, Microcantilevers

Proceedings Papers

Ratcheting Electrophoresis Microchip (REM) for Programmable Transport and Separation of Macromolecules

T. Ohara, A. Majumdar

Proc. ASME. IMECE2001, Micro-Electro-Mechanical Systems (MEMS), 619-628, November 11–16, 2001

Publisher: American Society of Mechanical Engineers

Paper No: IMECE2001/MEMS-23888

https://doi.org/10.1115/IMECE2001/MEMS-23888

View Paper titled, Ratcheting Electrophoresis Microchip (REM) for Programmable Transport and Separation of Macromolecules

Topics: Electrophoresis, Integrated circuits, Macromolecules, Microelectromechanical systems, Separation (Technology)

Proceedings Papers

Scanning Thermal Wave Microscopy

O. Kwon, L. Shi, A. Miner, A. Majumdar

Proc. ASME. IMECE2000, Heat Transfer: Volume 2, 385-391, November 5–10, 2000

Publisher: American Society of Mechanical Engineers

Paper No: IMECE2000-1451

https://doi.org/10.1115/IMECE2000-1451

View Paper titled, Scanning Thermal Wave Microscopy

Topics: Microscopy, Waves, Heat, Borosilicate glasses, Circuits, Glass, Imaging, Liquid films, Microscopes, Nanoscale phenomena

Journal Articles

Foreword

A. Majumdar, G. P. Peterson, D. Poulikakos

Publisher: ASME

J. Heat Mass Transfer. April 2002, 124(2): 221–222.

https://doi.org/10.1115/1.1464566

Published Online: April 1, 2002

View Article titled, Foreword

Topics: Heat, Heat transfer, Mass transfer, Nanoscale phenomena, Nanotechnology, Microelectronic devices

Journal Articles

Optical Measurement of Thermal Contact Conductance Between Wafer-Like Thin Solid Samples

Y. Ohsone, G. Wu, J. Dryden, F. Zok, A. Majumdar

Publisher: ASME

J. Heat Mass Transfer. November 1999, 121(4): 954–963.

https://doi.org/10.1115/1.2826086

Published Online: November 1, 1999

View Article titled, Optical Measurement of Thermal Contact Conductance Between Wafer-Like Thin Solid Samples

Topics: Contact resistance, Optical measurement, Semiconductor wafers

Journal Articles

Instability of Ultra-Thin Water Films and the Mechanism of Droplet Formation on Hydrophilic Surfaces

A. Majumdar, I. Mezic

Publisher: ASME

J. Heat Mass Transfer. November 1999, 121(4): 964–971.

https://doi.org/10.1115/1.2826087

Published Online: November 1, 1999

View Article titled, Instability of Ultra-Thin Water Films and the Mechanism of Droplet Formation on Hydrophilic Surfaces

Topics: Condensation, Drops, Water

Journal Articles

A Photothermal Technique for the Determination of the Thermal Conductance of Interfaces and Cracks

K. R. McDonald, J. R. Dryden, A. Majumdar, F. W. Zok

Publisher: ASME

J. Heat Mass Transfer. February 2000, 122(1): 10–14.

https://doi.org/10.1115/1.521430

Published Online: October 13, 1999

View Article titled, A Photothermal Technique for the Determination of the Thermal Conductance of Interfaces and Cracks

Topics: Delamination, Electrical conductance, Fracture (Materials), Thermal conductivity, Steel

Journal Articles

Nanoscale Temperature Distributions Measured by Scanning Joule Expansion Microscopy

A. Majumdar, J. Varesi

Publisher: ASME

J. Heat Mass Transfer. May 1998, 120(2): 297–305.

https://doi.org/10.1115/1.2824245

Published Online: May 1, 1998

View Article titled, Nanoscale Temperature Distributions Measured by Scanning Joule Expansion Microscopy

Topics: Joules, Microscopy, Nanoscale phenomena, Temperature, Temperature distribution, Atomic force microscopy, Imaging, Metals, Resolution (Optics), Signals

Journal Articles

A Fractal Model for the Rigid-Perfectly Plastic Contact of Rough Surfaces

T. L. Warren, A. Majumdar, D. Krajcinovic

Publisher: ASME

J. Appl. Mech. March 1996, 63(1): 47–54.

https://doi.org/10.1115/1.2787208

Published Online: March 1, 1996

View Article titled, A Fractal Model for the Rigid-Perfectly Plastic Contact of Rough Surfaces

Topics: Fractals, Surface roughness, Deformation, Displacement, Geometry, Steel, Stress

Journal Articles

Heat Generation and Transport in Submicron Semiconductor Devices

K. Fushinobu, A. Majumdar, K. Hijikata

Publisher: ASME

J. Heat Mass Transfer. February 1995, 117(1): 25–31.

https://doi.org/10.1115/1.2822317

Published Online: February 1, 1995

View Article titled, Heat Generation and Transport in Submicron Semiconductor Devices

Topics: Heat, Semiconductor devices, Electrons, Gallium arsenide, Phonons, Semiconductors (Materials), Acoustics, Electric fields, Electron mobility, Electronic equipment

Journal Articles

Discussion: “A Fractal Theory of the Interfacial Temperature Distribution in the Slow Sliding Regime: Part I—Elastic Contact and Heat Transfer Analysis” (Wang, S., and Komvopoulos, K., 1994, ASME J. Tribol., 116, pp. 812–822)

B. Bhushan, A. Majumdar

Publisher: ASME

J. Tribol. October 1994, 116(4): 822.

https://doi.org/10.1115/1.2927339

Published Online: October 1, 1994

View Article titled, Discussion: “A Fractal Theory of the Interfacial Temperature Distribution in the Slow Sliding Regime: Part I—Elastic Contact and Heat Transfer Analysis” (Wang, S., and Komvopoulos, K., 1994, ASME J. Tribol., 116, pp. 812–822)

Topics: Fractals, Heat transfer, Temperature distribution

Journal Articles

Microscale Heat Conduction in Dielectric Thin Films

A. Majumdar

Publisher: ASME

J. Heat Mass Transfer. February 1993, 115(1): 7–16.

https://doi.org/10.1115/1.2910673

Published Online: February 1, 1993

View Article titled, Microscale Heat Conduction in Dielectric Thin Films

Topics: Heat conduction, Microscale devices, Thin films

Journal Articles

Effect of Surface Deformations on Contact Conductance

M. Williamson, A. Majumdar

Publisher: ASME

J. Heat Mass Transfer. November 1992, 114(4): 802–810.

https://doi.org/10.1115/1.2911886

Published Online: November 1, 1992

View Article titled, Effect of Surface Deformations on Contact Conductance

Topics: Deformation, Electrical conductance, Aluminum, Stainless steel, Stress, Surface roughness, Cycles, Copper, Heat conduction, Metals

Journal Articles

AFM Imaging, Roughness Analysis and Contact Mechanics of Magnetic Tape and Head Surfaces

P. I. Oden, A. Majumdar, B. Bhushan, A. Padmanabhan, J. J. Graham

Publisher: ASME

J. Tribol. October 1992, 114(4): 666–674.

https://doi.org/10.1115/1.2920934

Published Online: October 1, 1992

View Article titled, AFM Imaging, Roughness Analysis and Contact Mechanics of Magnetic Tape and Head Surfaces

Topics: Atomic force microscopy, Contact mechanics, Imaging, Surface roughness, Fractals, Resolution (Optics), Instrumentation, Disks, Geometry, Magnetic particles

Journal Articles

Effect of Interfacial Roughness on Phonon Radiative Heat Conduction

A. Majumdar

Publisher: ASME

J. Heat Mass Transfer. November 1991, 113(4): 797–805.

https://doi.org/10.1115/1.2911206

Published Online: November 1, 1991

View Article titled, Effect of Interfacial Roughness on Phonon Radiative Heat Conduction

Topics: Heat conduction, Interface roughness, Phonons, Fractals, Temperature, Dimensions, Interfacial thermal resistance, Solids, Surface roughness, Acoustics

Journal Articles

Fractal Network Model for Contact Conductance

A. Majumdar, C. L. Tien

Publisher: ASME

J. Heat Mass Transfer. August 1991, 113(3): 516–525.

https://doi.org/10.1115/1.2910594

Published Online: August 1, 1991

View Article titled, Fractal Network Model for Contact Conductance

Topics: Electrical conductance, Fractals, Heat conduction, Network models, Surface roughness, Stress, Dimensions, Contact mechanics, Geometry, Heat

Journal citation

NARROW

Internal Temperature Distribution of a Vertical-Cavity Surface-Emitting Lasers Measured by Scanning Thermal Microscopy

Infrared Photodetection in the Picowatt Range Using Uncooled Micromechanical Sensors

Infrared Vision Using an Uncooled Thermo-Opto-Mechanical Camera: Design, Microfabrication, and Performance

Scanning Thermal Microscopy Study of Dissipation in Current-Carrying Carbon Nanotubes

Design and Fabrication of an Optomechanical Uncooled Infrared Imaging System

Ratcheting Electrophoresis Microchip (REM) for Programmable Transport and Separation of Macromolecules

Scanning Thermal Wave Microscopy

Foreword

Optical Measurement of Thermal Contact Conductance Between Wafer-Like Thin Solid Samples

Instability of Ultra-Thin Water Films and the Mechanism of Droplet Formation on Hydrophilic Surfaces

A Photothermal Technique for the Determination of the Thermal Conductance of Interfaces and Cracks

Nanoscale Temperature Distributions Measured by Scanning Joule Expansion Microscopy

A Fractal Model for the Rigid-Perfectly Plastic Contact of Rough Surfaces

Heat Generation and Transport in Submicron Semiconductor Devices

Discussion: “A Fractal Theory of the Interfacial Temperature Distribution in the Slow Sliding Regime: Part I—Elastic Contact and Heat Transfer Analysis” (Wang, S., and Komvopoulos, K., 1994, ASME J. Tribol., 116, pp. 812–822)

Microscale Heat Conduction in Dielectric Thin Films

Effect of Surface Deformations on Contact Conductance

AFM Imaging, Roughness Analysis and Contact Mechanics of Magnetic Tape and Head Surfaces

Effect of Interfacial Roughness on Phonon Radiative Heat Conduction

Fractal Network Model for Contact Conductance

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