Driven by new demands from industry, the field of acoustic imaging is rapidly evolving new approaches to meet the demands. The current trend toward micro and nano-technology has been pushing the operating frequency of scanning acoustic microscopes (SAM), from MHz to GHz. To become a useful tool for nondestructive evaluation (NDE), the SAM must give high resolution and also maintain reasonable depth of field below the sample surface, while overcoming the effects of surface roughness. A recent trend of needs for the SAM is to enhance resolution for detecting defects (e.g., microcracks, inclusions, debondings, delaminations), and develop a capability and an accuracy for obtaining quantitative data (e.g., velocities of waves, attenuation) for measuring residual stress, anisotropy, thickness of thin films, or the like. Furthermore, the SAM is to be modified to use in various environments. In this paper, a principle and some applications for both a practical shear wave lens and a noncontact lens will be summarized. [S0094-9930(00)02503-8]
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August 2000
Technical Papers
Recent Advances in Acoustic Microscopy for Nondestructive Evaluation
C. Miyasaka,
C. Miyasaka
Department of Engineering Science and Mechanics, The Pennsylvania State University, 212 Earth Engineering Sciences Building, University Park, PA 16802
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B. R. Tittmann
B. R. Tittmann
Department of Engineering Science and Mechanics, The Pennsylvania State University, 212 Earth Engineering Sciences Building, University Park, PA 16802
Search for other works by this author on:
C. Miyasaka
Department of Engineering Science and Mechanics, The Pennsylvania State University, 212 Earth Engineering Sciences Building, University Park, PA 16802
B. R. Tittmann
Department of Engineering Science and Mechanics, The Pennsylvania State University, 212 Earth Engineering Sciences Building, University Park, PA 16802
Contributed by the Pressure Vessels and Piping Division for publication in the JOURNAL OF PRESSURE VESSEL TECHNOLOGY. Manuscript received by the PVP Division, March 1, 2000; revised manuscript received April 12, 2000. Technical Editor: S. Y. Zamrik.
J. Pressure Vessel Technol. Aug 2000, 122(3): 374-378 (5 pages)
Published Online: April 12, 2000
Article history
Received:
March 1, 2000
Revised:
April 12, 2000
Citation
Miyasaka , C., and Tittmann, B. R. (April 12, 2000). "Recent Advances in Acoustic Microscopy for Nondestructive Evaluation ." ASME. J. Pressure Vessel Technol. August 2000; 122(3): 374–378. https://doi.org/10.1115/1.556195
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