We have batch-fabricated a microdevice consisting of two adjacent symmetric silicon nitride membranes suspended by long silicon nitride beams for measuring thermophysical properties of one-dimensional nanostructures (nanotubes, nanowires, and nanobelts) bridging the two membranes. A platinum resistance heater/thermometer is fabricated on each membrane. One membrane can be Joule heated to cause heat conduction through the sample to the other membrane. Thermal conductance, electrical conductance, and Seebeck coefficient can be measured using this microdevice in the temperature range of 4–400 K of an evacuated Helium cryostat. Measurement sensitivity, errors, and uncertainty are discussed. Measurement results of a 148 nm and a 10 nm-diameter single wall carbon nanotube bundle are presented.
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e-mail: lishi@mail.utexas.edu
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Measuring Thermal and Thermoelectric Properties of One-Dimensional Nanostructures Using a Microfabricated Device
Li Shi,
e-mail: lishi@mail.utexas.edu
Li Shi
Department of Mechanical Engineering, Center for Nano and Molecular Science and Technology, University of Texas at Austin, TX 78712
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Deyu Li,
Deyu Li
Department of Mechanical Engineering, University of California, Berkeley, CA 94720
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Choongho Yu,
Choongho Yu
Department of Mechanical Engineering, Center for Nano and Molecular Science and Technology, University of Texas at Austin, TX 78712
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Wanyoung Jang,
Wanyoung Jang
Department of Physics, Department of Mechanical Engineering, University of California, Berkeley, CA 94720
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Dohyung Kim,
Dohyung Kim
Department of Mechanical Engineering, Center for Nano and Molecular Science and Technology, University of Texas at Austin, TX 78712
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Zhen Yao,
Zhen Yao
Department of Physics, Department of Mechanical Engineering, University of California, Berkeley, CA 94720
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Philip Kim,
Philip Kim
Department of Physics, Columbia University, New York
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Arunava Majumdar
Arunava Majumdar
Materials Science Division, Lawrence Berkeley National Laboratory, Department of Mechanical Engineering, University of California, Berkeley, CA 94720
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Li Shi
Department of Mechanical Engineering, Center for Nano and Molecular Science and Technology, University of Texas at Austin, TX 78712
e-mail: lishi@mail.utexas.edu
Deyu Li
Department of Mechanical Engineering, University of California, Berkeley, CA 94720
Choongho Yu
Department of Mechanical Engineering, Center for Nano and Molecular Science and Technology, University of Texas at Austin, TX 78712
Wanyoung Jang
Department of Physics, Department of Mechanical Engineering, University of California, Berkeley, CA 94720
Dohyung Kim
Department of Mechanical Engineering, Center for Nano and Molecular Science and Technology, University of Texas at Austin, TX 78712
Zhen Yao
Department of Physics, Department of Mechanical Engineering, University of California, Berkeley, CA 94720
Philip Kim
Department of Physics, Columbia University, New York
Arunava Majumdar
Materials Science Division, Lawrence Berkeley National Laboratory, Department of Mechanical Engineering, University of California, Berkeley, CA 94720
Contributed by the Heat Transfer Division for publication in the JOURNAL OF HEAT TRANSFER. Manuscript received by the Heat Transfer Division October 14, 2002; revision received April 8, 2003. Associate Editor: G. Chen.
J. Heat Transfer. Oct 2003, 125(5): 881-888 (8 pages)
Published Online: September 23, 2003
Article history
Received:
October 14, 2002
Revised:
April 8, 2003
Online:
September 23, 2003
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Citation
Shi, L., Li, D., Yu, C., Jang, W., Kim, D., Yao, Z., Kim, P., and Majumdar, A. (September 23, 2003). "Measuring Thermal and Thermoelectric Properties of One-Dimensional Nanostructures Using a Microfabricated Device ." ASME. J. Heat Transfer. October 2003; 125(5): 881–888. https://doi.org/10.1115/1.1597619
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