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Keywords: tin
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Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. December 2011, 133(4): 041014.
Published Online: December 21, 2011
...-copper system with a gold-tin solder bond layer. The results obtained are likely to be useful in interfacial stress evaluation and physical design of bimaterial assemblies used in microelectronics and photonics applications. Consider a plate of unit thickness subjected to unit shear stress...
Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Technical Briefs
J. Electron. Packag. December 2010, 132(4): 044501.
Published Online: December 3, 2010
... 24 02 2010 24 09 2010 03 12 2010 03 12 2010 chip-on-board packaging contact resistance gold lead bonding tape automated bonding thin films tin In the past two decades, liquid crystal displays (LCDs) have a big market share in the industry of flat panel display...
Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. September 2009, 131(3): 031014.
Published Online: July 31, 2009
... combined with the no-flow underfill material curing on underfill voiding during assembly process. Figure 5 presented two micrographs of voids formed during the reflow process in TV-1 and TV-2, respectively. TV-1, consisting of a glass cover slide on the underfill deposited substrate without lead-tin...
Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. December 2005, 127(4): 446–451.
Published Online: January 13, 2005
...Ming-Hwa R. Jen; Lee-Cheng Liu; Jenq-Dah Wu The work is aimed to investigate the mechanical responses of bare dies of the combination of pure tin ∕ Al – Ni V – Cu Under bump metallization (UBM) and packages of pure tin ∕ Al – Ni V – Cu UBM/substrate of standard thickness of aurum. The mechanical...
Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Technical Papers
J. Electron. Packag. March 2004, 126(1): 148–158.
Published Online: April 30, 2004
... in the JOURNAL OF ELECTRONIC PACKAGING . Manuscript received March 2003; final revision, September 2003. Associate Editor: E. Lorenzini. 01 March 2003 01 September 2003 30 04 2004 tin lead solders elastic constants fatigue viscoplasticity Newton-Raphson method numerical analysis...
Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Technical Briefs
J. Electron. Packag. December 2003, 125(4): 621–624.
Published Online: December 15, 2003
...John H. Lau; Stephen H. Pan In this study, a three-dimensional (3D) nonlinear stress analysis of the tin whisker initiation on a pure matte Sn-plated copper substrate is investigated. The structure is subjected to a compressive stress acting at the Sn layer which is generated by the spontaneous...