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Issues
September 2010
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Editorial
Editorial
J. Electron. Packag. September 2010, 132(3): 030201.
doi: https://doi.org/10.1115/1.3493694
Topics:
Electronic packaging
,
Cooling
,
Reliability
Research Papers
Digital Moiré Subtraction Interferometry (DMS) for Electronics Cooling Applications in Enclosures
J. Electron. Packag. September 2010, 132(3): 031001.
doi: https://doi.org/10.1115/1.4002161
Topics:
Cylinders
,
Interferometers
,
Interferometry
,
Temperature
,
Flow (Dynamics)
,
Cooling
,
Thermal conductivity
,
Natural convection
,
Computer cooling
Solid-State Microrefrigeration in Conjunction With Liquid Cooling
J. Electron. Packag. September 2010, 132(3): 031002.
doi: https://doi.org/10.1115/1.4001853
Topics:
Cooling
,
Temperature
,
Thermoelectric coolers
,
Thin films
Three-Dimensional Measurements of Photo-curing Process With Photo-curable Resin for UV-Nanoimprint by Micro-digital-Holographic-PTV
J. Electron. Packag. September 2010, 132(3): 031003.
doi: https://doi.org/10.1115/1.4001854
Topics:
Hardening (Curing)
,
Particulate matter
,
Resins
,
Ultraviolet radiation
,
Glass
,
Holography
,
Temperature
,
Displacement
,
Microchannels
How to Estimate Heat Spreading Effects in Practice
J. Electron. Packag. September 2010, 132(3): 031004.
doi: https://doi.org/10.1115/1.4001856
Topics:
Heat
,
Thermal resistance
,
Thermal conductivity
,
Temperature
Study on a Pulsating Heat Pipe With Self-Rewetting Fluid
J. Electron. Packag. September 2010, 132(3): 031005.
doi: https://doi.org/10.1115/1.4001855
Topics:
Fluids
,
Heat pipes
,
Temperature
,
Water
,
Surface tension
,
Heat transfer
,
Thermal resistance
,
Heat
Coordinated Optimization of Cooling and IT Power in Data Centers
J. Electron. Packag. September 2010, 132(3): 031006.
doi: https://doi.org/10.1115/1.4001858
Topics:
Cooling
,
Data centers
,
Design
,
Optimization
,
Modeling
,
Energy consumption
CFD-Assisted Optimization of Chimneylike Flows to Cool an Electronic Device
J. Electron. Packag. September 2010, 132(3): 031007.
doi: https://doi.org/10.1115/1.4002009
Interactions Between Flip Chip Underfill and Solder Alloy
J. Electron. Packag. September 2010, 132(3): 031008.
doi: https://doi.org/10.1115/1.4002010
Topics:
Alloys
,
Flip-chip
,
Flip-chip devices
,
Solders
,
Thermal shock
,
Thermal expansion
,
Testing
,
Adhesion
,
Reliability
,
Cycles
Design of Practical Liquid Metal Cooling Device for Heat Dissipation of High Performance CPUs
J. Electron. Packag. September 2010, 132(3): 031009.
doi: https://doi.org/10.1115/1.4002012
Topics:
Cooling
,
Design
,
Energy dissipation
,
Heat
,
Liquid metals
,
Pumps
,
Thermal resistance
,
Water
,
Flow (Dynamics)
,
Engineering prototypes
Phosphor Concentration Effects on Optothermal Characteristics of Phosphor Converted White Light-Emitting Diodes
J. Electron. Packag. September 2010, 132(3): 031010.
doi: https://doi.org/10.1115/1.4002298
Topics:
Junctions
,
Light-emitting diodes
,
Phosphors
,
Temperature
Reliability of High-Power Light Emitting Diode Attached With Different Thermal Interface Materials
J. Electron. Packag. September 2010, 132(3): 031011.
doi: https://doi.org/10.1115/1.4002299
Topics:
Bonding
,
Epoxy adhesives
,
Epoxy resins
,
Light-emitting diodes
,
Packaging
,
Reliability
,
Silver
,
Temperature
,
Tin
,
Heat
Reliability Evaluation on Deterioration of Power Device Using Coupled Electrical-Thermal-Mechanical Analysis
J. Electron. Packag. September 2010, 132(3): 031012.
doi: https://doi.org/10.1115/1.4002451
Topics:
Bonding
,
Crack propagation
,
Fatigue life
,
Fracture (Materials)
,
Reliability
,
Solder joints
,
Temperature
,
Temperature distribution
,
Wire
,
Wire bonding
Design Innovation
Silver Flip-Chip Technology by Solid-State Bonding
J. Electron. Packag. September 2010, 132(3): 035001.
doi: https://doi.org/10.1115/1.4002297
Topics:
Bonding
,
Flip-chip
,
Silver
,
Silicon chips
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