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Issues
September 1998
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Editor’s Note
Fiber Optics Structural Mechanics: Brief Review
J. Electron. Packag. September 1998, 120(3): 217–220.
doi: https://doi.org/10.1115/1.2792625
Topics:
Optical fiber
,
Structural analysis
Technical Papers
Analysis of Bending and Shearing of Tri-Layer Laminations for Solder Joint Reliability
J. Electron. Packag. September 1998, 120(3): 221–228.
doi: https://doi.org/10.1115/1.2792626
Topics:
Die cutting
,
Lamination
,
Reliability
,
Shearing (Deformation)
,
Solder joints
,
Fatigue life
,
Shear (Mechanics)
,
Silicon
,
Stress
,
Temperature
Thermal Enhancement Coatings for Microelectronic Systems
J. Electron. Packag. September 1998, 120(3): 229–237.
doi: https://doi.org/10.1115/1.2792627
Topics:
Coatings
,
Electronic components
,
Failure
,
Heat
Avionics Passive Cooling With Microencapsulated Phase Change Materials
J. Electron. Packag. September 1998, 120(3): 238–242.
doi: https://doi.org/10.1115/1.2792628
Topics:
Avionics
,
Cooling
,
Phase change materials
,
Aircraft
,
Aluminum plate
,
Design
,
Heat sinks
,
Missiles
,
Weight (Mass)
Forced Convective Liquid Cooling of Arrays of Protruding Heated Elements Mounted in a Rectangular Duct
J. Electron. Packag. September 1998, 120(3): 243–252.
doi: https://doi.org/10.1115/1.2792629
Topics:
Cooling
,
Ducts
,
Heat
,
Reynolds number
,
Heat transfer
,
Water
,
Algebra
,
Buoyancy
,
Flow (Dynamics)
,
Flow visualization
Random Change of Vibration Modes in Thermosonic Bonding
J. Electron. Packag. September 1998, 120(3): 253–258.
doi: https://doi.org/10.1115/1.2792630
Topics:
Bonding
,
Vibration
,
Friction
,
End effectors
,
Excitation
,
Flip-chip assemblies
,
Generators
,
Modal analysis
,
Process control
,
Resonance
Optimization of Finned Heat Sinks for Impingement Cooling of Electronic Packages
J. Electron. Packag. September 1998, 120(3): 259–266.
doi: https://doi.org/10.1115/1.2792631
Evaluation of Elasto-Plastic Interfacial Fracture Parameters in Solder-Copper Bimaterial Using Moire´ Interferometry
J. Electron. Packag. September 1998, 120(3): 267–274.
doi: https://doi.org/10.1115/1.2792632
Topics:
Copper
,
Fracture (Materials)
,
Fracture (Process)
,
Interferometry
,
Solders
,
Deformation
,
Failure
,
Fracture toughness
,
Geometry
,
Strain gages
Applications of Digital Speckle Correlation to Microscopic Strain Measurement and Materials’ Property Characterization
J. Electron. Packag. September 1998, 120(3): 275–279.
doi: https://doi.org/10.1115/1.2792633
Topics:
Hardware
,
Manufacturing
,
Reliability
,
Resolution (Optics)
,
Strain measurement
The Effects of Material Properties on Heat Dissipation in High Power Electronics
J. Electron. Packag. September 1998, 120(3): 280–289.
doi: https://doi.org/10.1115/1.2792634
Topics:
Electronics
,
Energy dissipation
,
Heat
,
Materials properties
,
Thermal conductivity
,
Cooling
,
Approximation
,
Diamonds
,
Dimensions
,
Insulation
Package-to-Board Attach Reliability — Methodology and Case Study on OMPAC Package
J. Electron. Packag. September 1998, 120(3): 290–295.
doi: https://doi.org/10.1115/1.2792635
Topics:
Reliability
,
Temperature
,
Solders
,
Cycles
,
Finite element methods
,
Simulation
,
Creep
,
Failure
,
Simulation results
,
Ball-Grid-Array packaging
Performance Analysis of Double Stack Cold Plates Covering All Conditions of Asymmetric Heat Loading
J. Electron. Packag. September 1998, 120(3): 296–301.
doi: https://doi.org/10.1115/1.2792636
Topics:
Heat
,
Plates (structures)
,
Temperature
,
Composite materials
,
Fins
,
Stress
A Two-Body Formulation for Solder Joint Shape Prediction
J. Electron. Packag. September 1998, 120(3): 302–308.
doi: https://doi.org/10.1115/1.2792637
Topics:
Shapes
,
Solder joints
,
Solders
,
Drops
,
Ball-Grid-Array packaging
,
Ceramics
,
Design
,
Fatigue life
,
Finite element analysis
,
Flip-chip
Process Induced Stresses of a Flip-Chip Packaging by Sequential Processing Modeling Technique
J. Electron. Packag. September 1998, 120(3): 309–313.
doi: https://doi.org/10.1115/1.2792638
Topics:
Flip-chip
,
Modeling
,
Packaging
,
Stress
,
Manufacturing
,
Deflection
,
Finite element analysis
,
Warping
,
Alloys
,
Bonding
Technical Brief
In Situ Evaluation of Residual Stresses in an Organic Die-Attach Adhesive
J. Electron. Packag. September 1998, 120(3): 314–318.
doi: https://doi.org/10.1115/1.2792639
Topics:
Adhesives
,
Residual stresses
,
Epoxy adhesives
,
Epoxy resins
,
Stress
,
Hardening (Curing)
,
Absorption
,
Cooling
,
Interferometry
,
Relaxation (Physics)