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Issues
September 1991
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Research Papers
Piezoresistive Stress Sensors for Structural Analysis of Electronic Packages
J. Electron. Packag. September 1991, 113(3): 203–215.
doi: https://doi.org/10.1115/1.2905397
Topics:
Electronic packages
,
Sensors
,
Stress
,
Structural analysis
,
Semiconductor wafers
,
Crystals
,
Design
,
Diamonds
,
Heat conduction
,
Integrated circuits
A Fundamental Study of the Tape Automated Bonding Process
J. Electron. Packag. September 1991, 113(3): 216–225.
doi: https://doi.org/10.1115/1.2905398
Topics:
Bonding
Stress Analyses of Flip TAB Interconnects in Multi-Chip Module Assembly
J. Electron. Packag. September 1991, 113(3): 226–232.
doi: https://doi.org/10.1115/1.2905399
Topics:
Manufacturing
,
Multi-chip modules
,
Stress analysis (Engineering)
,
Stress
,
Finite element methods
,
Bearings
,
Design
,
Energy dissipation
,
Failure
,
Heat
Stress Analysis of the Vertical Interconnect for Three-Dimensional Packaging
J. Electron. Packag. September 1991, 113(3): 233–239.
doi: https://doi.org/10.1115/1.2905400
Stress Relief in Solder Joints Due to the Application of a Flex Circuit
J. Electron. Packag. September 1991, 113(3): 240–243.
doi: https://doi.org/10.1115/1.2905401
Topics:
Flexible electronics
,
Solder joints
,
Stress
,
Buckling
,
Design
,
Fatigue life
,
Stress analysis (Engineering)
,
Thermal expansion
Experimental Modal Analysis and Dynamic Response Prediction of PC Boards With Surface Mount Electronic Components
J. Electron. Packag. September 1991, 113(3): 244–249.
doi: https://doi.org/10.1115/1.2905402
The "Smeared" Property Technique for the FE Vibration Analysis of Printed Circuit Cards
J. Electron. Packag. September 1991, 113(3): 250–257.
doi: https://doi.org/10.1115/1.2905403
Heat Transfer and Thermal Stress Analysis of an Optoelectronic Package
J. Electron. Packag. September 1991, 113(3): 258–262.
doi: https://doi.org/10.1115/1.2905404
Reliability Monitoring in Drilling Electronic Circuit Boards
J. Electron. Packag. September 1991, 113(3): 263–267.
doi: https://doi.org/10.1115/1.2905405
Influence of Discrete Heat Source Location on Natural Convection Heat Transfer in a Vertical Square Enclosure
J. Electron. Packag. September 1991, 113(3): 268–274.
doi: https://doi.org/10.1115/1.2905406
Topics:
Heat
,
Heat transfer
,
Natural convection
,
Heat conduction
,
Rayleigh number
,
Thermal conductivity
A Probabilistic Approach for Predicting Thermal Fatigue Life of Wire Bonding in Microelectronics
J. Electron. Packag. September 1991, 113(3): 275–285.
doi: https://doi.org/10.1115/1.2905407
Topics:
Fatigue life
,
Microelectronic devices
,
Wire bonding
,
Wire
,
Fatigue failure
,
Reliability
,
Stress
,
Temperature
,
Uncertainty
,
Bonding
Temperature Mapping of Localized Hot Spots on Microelectronic Chip Surfaces
J. Electron. Packag. September 1991, 113(3): 286–293.
doi: https://doi.org/10.1115/1.2905408
Heat Transfer Study of Staggered Thin Rectangular Blocks in a Channel Flow
J. Electron. Packag. September 1991, 113(3): 294–300.
doi: https://doi.org/10.1115/1.2905409
Topics:
Channel flow
,
Heat transfer
,
Heat exchangers
,
Flow (Dynamics)
,
Separation (Technology)
,
Temperature
,
Computation
,
Fluid dynamics
,
Fluids
,
Numerical analysis
Natural Convection Cooling of a Horizontally Oriented Component Board Mounted in a Low-Aspect-Ratio Enclosure
J. Electron. Packag. September 1991, 113(3): 301–308.
doi: https://doi.org/10.1115/1.2905410
Topics:
Cooling
,
Natural convection
,
Electronic components
,
Geometry
,
Heat flux
,
Heat transfer
,
Rayleigh number
,
Temperature
Mixed Convective Heat Transfer From a Simulated Microchip to Liquid Flows in a Horizontal Rectangular Channel
J. Electron. Packag. September 1991, 113(3): 309–312.
doi: https://doi.org/10.1115/1.2905411
Topics:
Convection
,
Flow (Dynamics)
,
Integrated circuits
,
Heat transfer
,
Buoyancy
,
Forced convection
,
Mixed convection
,
Rayleigh number
,
Reynolds number
Optimal Thermal Design of Forced Convection Heat Sinks-Analytical
J. Electron. Packag. September 1991, 113(3): 313–321.
doi: https://doi.org/10.1115/1.2905412
Topics:
Design
,
Forced convection
,
Heat
,
Coolants
,
Cooling
,
Dimensions
,
Optimization
,
Thermal resistance
,
Copper
,
Flow (Dynamics)
Technical Briefs
Statistical Energy Analysis for Electronic Equipment
J. Electron. Packag. September 1991, 113(3): 322–325.
doi: https://doi.org/10.1115/1.2905413
Topics:
Electronic equipment
,
Seas
,
Vibration
,
Finite element model
,
Instrumentation
,
Vibration analysis
Analysis of Transient State Temperature Distribution in the Thyristor Packaging
J. Electron. Packag. September 1991, 113(3): 325–328.
doi: https://doi.org/10.1115/1.2905414
Book Reviews
The Finite Element in Thermomechanics
J. Electron. Packag. September 1991, 113(3): 329.
doi: https://doi.org/10.1115/1.2905415
Topics:
Finite element analysis
,
Thermomechanics
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