The fatigue life estimation of solder joints is one of the most critical requirements in the development of reliable electronic components. In this study, we first examined a constitutive model for Sn63-Pb37 solder based on the results of material tests. It was confirmed that the behavior of the solder material can be expressed by the elastic-creep constitutive equations when the strain rate was low. Secondly, elastic-creep stress analysis was carried out for the solder joints of a SMT-PGA (surface mount technology pin grid array) package. The location of the failure predicted by the analytical results agreed well with those of the thermal cycle tests (TCT). It was shown that the fatigue life estimation of solder joints based on the present method is satisfactory for engineering purposes.
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June 1998
Technical Papers
Fatigue Life Estimation of Solder Joints in SMT-PGA Packages
M. Mukai,
M. Mukai
Research and Development Center, Toshiba Corporation, 4-1, Ukishima-cho, Kawasaki-ku, Kawasaki 210, Japan
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T. Kawakami,
T. Kawakami
Research and Development Center, Toshiba Corporation, 4-1, Ukishima-cho, Kawasaki-ku, Kawasaki 210, Japan
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Y. Hiruta,
Y. Hiruta
Semiconductor Device Engineering Laboratory, Toshiba Corporation, 1, Komukai-Toshiba-cho, Saiwai-ku, Kawasaki 210, Japan
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K. Takahashi,
K. Takahashi
Ome Works, Toshiba Corporation, 2-9, Suehiro-cho, Ome-city, Tokyo 198, Tokyo
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K. Kishimoto,
K. Kishimoto
Department of Mechanical and Intelligent Systems Engineering, Tokyo Institute of Technology, 2-12-1, Ohokayama, Meguro-ku, Tokyo 152, Japan
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T. Shibuya
T. Shibuya
Department of Mechanical and Intelligent Systems Engineering, Tokyo Institute of Technology, 2-12-1, Ohokayama, Meguro-ku, Tokyo 152, Japan
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M. Mukai
Research and Development Center, Toshiba Corporation, 4-1, Ukishima-cho, Kawasaki-ku, Kawasaki 210, Japan
T. Kawakami
Research and Development Center, Toshiba Corporation, 4-1, Ukishima-cho, Kawasaki-ku, Kawasaki 210, Japan
Y. Hiruta
Semiconductor Device Engineering Laboratory, Toshiba Corporation, 1, Komukai-Toshiba-cho, Saiwai-ku, Kawasaki 210, Japan
K. Takahashi
Ome Works, Toshiba Corporation, 2-9, Suehiro-cho, Ome-city, Tokyo 198, Tokyo
K. Kishimoto
Department of Mechanical and Intelligent Systems Engineering, Tokyo Institute of Technology, 2-12-1, Ohokayama, Meguro-ku, Tokyo 152, Japan
T. Shibuya
Department of Mechanical and Intelligent Systems Engineering, Tokyo Institute of Technology, 2-12-1, Ohokayama, Meguro-ku, Tokyo 152, Japan
J. Electron. Packag. Jun 1998, 120(2): 207-212 (6 pages)
Published Online: June 1, 1998
Article history
Received:
May 19, 1997
Revised:
January 13, 1998
Online:
November 6, 2007
Citation
Mukai, M., Kawakami, T., Hiruta, Y., Takahashi, K., Kishimoto, K., and Shibuya, T. (June 1, 1998). "Fatigue Life Estimation of Solder Joints in SMT-PGA Packages." ASME. J. Electron. Packag. June 1998; 120(2): 207–212. https://doi.org/10.1115/1.2792623
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