A dynamic model is established to investigate tombstoning phenomenon of passive SMT components during reflow. This model consists of three dynamic equations for the motion of the component and four nonlinear algebraic equations for area conservation, constant curvatures for solder fillets, and solder height-length relations. The formulation neglects the gravity effect in the solder. It is shown that formation of tombstoning depends on a combination of parameters such as component geometry, pad sizes, gap size between pads, molten solder volume and properties, and contact angles. For some values of these parameters encountered in practice, tombstoning can take place. For a given component, this model may be used to improve solder pad and stencil designs to avoid tombstoning.
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March 1998
Technical Papers
Analysis of Tombstoning Phenomenon During Reflow
Q. Qi,
Q. Qi
CAMPmode, Campus Box 427, Department of Mechanical Engineering, University of Colorado, Boulder, CO 80309-0427
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R. L. Mahajan
R. L. Mahajan
CAMPmode, Campus Box 427, Department of Mechanical Engineering, University of Colorado, Boulder, CO 80309-0427
Search for other works by this author on:
Q. Qi
CAMPmode, Campus Box 427, Department of Mechanical Engineering, University of Colorado, Boulder, CO 80309-0427
R. L. Mahajan
CAMPmode, Campus Box 427, Department of Mechanical Engineering, University of Colorado, Boulder, CO 80309-0427
J. Electron. Packag. Mar 1998, 120(1): 61-67 (7 pages)
Published Online: March 1, 1998
Article history
Received:
March 1, 1997
Revised:
September 1, 1997
Online:
November 6, 2007
Citation
Qi, Q., and Mahajan, R. L. (March 1, 1998). "Analysis of Tombstoning Phenomenon During Reflow." ASME. J. Electron. Packag. March 1998; 120(1): 61–67. https://doi.org/10.1115/1.2792287
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