Thermomechanical behavior of solder interconnections of a ceramic column grid array package assembly is characterized by high sensitivity moire´ interferometry. The in situ thermal deformations of the most distant column from the axis-of-symmetry are documented for (a) an initial isothermal loading of ΔT = −60° and (2) subsequent accelerated thermal cycles of (20°C)−(125°C)−(−40°C)−(20°C). The deformed shape of the column obtained from the displacement fields clearly delineates the effect of the eutectic solder fillet on the column deformation accumulated during accelerated thermal cycling. A deformation mechanism is suggested to explain the results, which is confirmed by the results from the actual accelerated thermal cycle test of the same assembly. The distributions of inelastic strains accumulated during thermal cycles are determined along the sides of the column. The results emphasize the importance of the solder fillet height for optimum reliability. The effect of specimen preparation required for the moire´ experiment on the column deformation is also discussed to validate the experimental data.

1.
Banks, D. R., Heim, V. R., Lewis, H., Caron, A., and Cole, M. S., 1993, “Second-Level Assembly of Column Grid Array Packages,” Proceedings of Surface Mount International, pp. 92–98.
2.
Caulfield, T., Cole, M. S., Cappo, F., Zitz, J., and Benenati, J., 1995, “An Overview of Ceramic Ball and Column Grid Array Packaging,” Chap. 5, in Ball Grid Array Technology, J. Lau, ed., McGraw-Hill, New York, NY, pp. 131–169.
3.
Caulfield, T., Benenati, J. A., and Acocella, J., 1993, “Surface Mount Array Interconnections for High I/O MCM-C to Card Assemblies,” Proceedings of 1993 ISHM/MCM, pp. 320–325.
4.
Corbin
 
J. S.
,
1993
, “
Finite Element Analysis for Solder Ball Connect (SBC) Structural Design Optimization
,”
IBM Journal of Research and Development
, Vol.
37
, No.
5
, pp.
585
596
.
5.
Guo
 
Y.
,
Lim
 
C. K.
,
Chen
 
W. T.
, and
Woychik
 
C. G.
,
1993
, “
Solder Ball Connect (SBC) Assemblies Under Thermal Loading: I. Deformation Measurement via Moire´ Interferometry, and Its Interpretation
,”
IBM Journal of Research and Development
, Vol.
37
, No.
5
, pp.
635
648
.
6.
Han, B., Guo, Y., and Caletka, D., 1995, “On the Effect of Moire´ Specimen Preparation on Solder Ball Strains of Ball Grid Array Package Assembly,” Proceedings of the 1995 SEM Spring Conference on Experimental Mechanics, Grand Rapid, MI.
7.
Han
 
B.
, and
Guo
 
Y.
,
1995
, “
Thermal Deformation Analysis of Various Electronic Packaging Products by Moire´ and Microscopic Moire´ Interferometry
,”
ASME JOURNAL OF ELECTRONIC PACKAGING
, Vol.
117
, No.
3
, pp.
185
191
.
8.
Han
 
B.
,
Guo
 
Y.
,
Lim
 
C. K.
, and
Caletka
 
D.
,
1996
, “
Verification of Numerical Models Used in Microelectronics Packaging Design by Interferometric Displacement Measurement Methods
,”
ASME JOURNAL OF ELECTRONIC PACKAGING
, Vol.
118
, No.
3
, pp.
157
163
.
9.
Lindley, T. R., 1995, “BGA Solder Joint Reliability Study for Automotive Electronics,” Proceedings of 1995 ICEMCM ’95, pp. 126–133.
10.
Masters, R., Cole, M. S., Martin, G. B., and Caron, A., 1995, “Ceramic Column Grid Array for Flip Chip Applications,” Proceedings of 1995 ECTC, pp. 925–929.
11.
Post, D., Han, B., and Ifju, P., 1994a, “Moire´ Interferometry,” Chap. 4, in High Sensitivity Moire´: Experimental Analysis for Mechanics and Materials, Springer-Verlag, New York, NY, pp. 135–226.
12.
Post, D., Han, B., and Ifju, P., 1994b, “Elements of Optics,” Chap. 2, in High Sensitivity Moire´: Experimental Analysis for Mechanics and Materials, Springer-Verlag, New York, NY, pp. 48–53.
This content is only available via PDF.
You do not currently have access to this content.