Thermomechanical behavior of solder interconnections of a ceramic column grid array package assembly is characterized by high sensitivity moire´ interferometry. The in situ thermal deformations of the most distant column from the axis-of-symmetry are documented for (a) an initial isothermal loading of ΔT = −60° and (2) subsequent accelerated thermal cycles of (20°C)−(125°C)−(−40°C)−(20°C). The deformed shape of the column obtained from the displacement fields clearly delineates the effect of the eutectic solder fillet on the column deformation accumulated during accelerated thermal cycling. A deformation mechanism is suggested to explain the results, which is confirmed by the results from the actual accelerated thermal cycle test of the same assembly. The distributions of inelastic strains accumulated during thermal cycles are determined along the sides of the column. The results emphasize the importance of the solder fillet height for optimum reliability. The effect of specimen preparation required for the moire´ experiment on the column deformation is also discussed to validate the experimental data.
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September 1997
Technical Papers
Deformation Mechanism of Two-Phase Solder Column Interconnections Under Highly Accelerated Thermal Cycling Condition: An Experimental Study
B. Han
B. Han
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B. Han
J. Electron. Packag. Sep 1997, 119(3): 189-196 (8 pages)
Published Online: September 1, 1997
Article history
Received:
July 15, 1996
Revised:
March 1, 1997
Online:
November 6, 2007
Citation
Han, B. (September 1, 1997). "Deformation Mechanism of Two-Phase Solder Column Interconnections Under Highly Accelerated Thermal Cycling Condition: An Experimental Study." ASME. J. Electron. Packag. September 1997; 119(3): 189–196. https://doi.org/10.1115/1.2792233
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